Proof of concept for real-time detection of mycotoxins in grain using hyperspectral imagery

White grain in wheat is a serious concern at grain receival sites due to the potential for mycotoxins produced by the fungal pathogen in instances of fusarium head blight. White grains may be caused by multiple fungal species, with mycotoxins typically being produced in larger quantities by Fusarium graminearum and lower quantities by Fusarium pseudograminearum. Deoxynivalenol (DON) is one of the main mycotoxins of concern produced by Fusarium and is of particular concern to the wheat, barley and oat industries. However, Eutiarosporella spp. may also cause white grain but do not produce mycotoxins. Due to the potential impact on human and livestock health, white grain can often be the cause for rejection of a load of grain, despite not all white grains containing mycotoxins. Development of technology that would allow quick and accurate detection of the level of mycotoxins in grain could allow personnel at grain receivals to make more informed decisions around rejection of grain containing white grains. Hyperspectral imaging (HSI) uses both spectral and spatial data to allow large quantities of grain to be assessed with potential for use on grain conveyors for continuous monitoring. Past work by QDAF have demonstrated the ability for HSI to detect artificially added quantities of the DON mycotoxin to wheat grains. However, it is uncertain how successful HSI will be in detecting DON from naturally infected wheat grains with fungi present. Therefore, this investment aims to explore the potential for this technology to detect naturally occurring mycotoxins in wheat as a proof of concept.